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Condensed Matter Seminar: Advancing Scanning Transmission Electron Microscopy for Materials Characterization

Date:
-
Location:
CP179
Speaker(s) / Presenter(s):
Jinwoo Hwang (OSU)
Development of new multi-scale characterization tools and techniques is critical for the 
design and synthesis of future materials.  Within the last decade, instrumentation for 
(scanning) transmission electron microscopy (S/TEM) has made tremendous progress.  
The next phase is to utilize these advances to solve the eminent materials problems of 
today.  This requires the development of S/TEM techniques that can achieve, for 
example, atomic scale 3D information, variable resolution, high precision, and atomic 
scale analysis of non-crystalline or soft materials, including biological systems.  I will 
present recent advances in developing novel S/TEM techniques that allow for 
understanding the structural origins of materials functionality and dynamics from atomic 
to meso scale, in several representative materials systems.  These new techniques include 
quantitative S/TEM for atomic scale 3D imaging of dopants, position averaged 
convergent beam electron diffraction for functional oxides, and electron nanodiffraction 
and fluctuation microscopy for non-crystalline and soft materials.  Combined with in-situ 
conditions, and data prediction, and analysis based on advanced computational 
simulations, these novel techniques provide powerful tools for the structural 
determination of future materials beyond current limitations.
 
BIO
Jinwoo Hwang is an Assistant Professor in the Department of Materials Science and 
Engineering at the Ohio State University.  Prior to joining OSU, Jinwoo was a 
postdoctoral researcher at the University of California, Santa Barbara.  He received his 
Ph.D. from the University of Wisconsin, Madison in 2011.  His research interests include 
advanced structural characterization of materials, S/TEM technique development, and 
computational materials modeling.  In particular, he has developed novel S/TEM 
techniques and simulation methods based on electron nanodiffraction and quantitative 
imaging, for nanostructured materials, oxide heterostructures, and non-crystalline 
materials.  For his contributions to the field, he has received several honors and awards, 
including The Albert Crewe award from the Microscopy Society of America in 2014.